NI美国 PXIe-4139 PXI源测量单元 总线连接器

NI美国 PXIe-4139 PXI源测量单元 总线连接器

NI美国 PXIe-4139 PXI源测量单元 总线连接器

NI美国PXIe-4139 PXI源测量单元是一款高精度系统源测量单元（SMU），具有出色的性能和广泛的应用领域。以下是对该产品的详细介绍：

一、产品概述

• 品牌：美国国家仪器（National Instruments，简称NI）
• 型号：PXIe-4139
• 类型：PXI源测量单元

二、技术规格

1. 电压和电流范围：
• 可提供±60V的直流电压和±3A的直流电流。
• 脉冲电流能力达到±10A。
2. 功率：
• 直流功率输出高达40W。
3. 测量精度：
• 配备模数转换器，能够以100fA的电流分辨率执行高精度测量。
• 高速采集能力高达1.8MS/s。
4. 操作模式：
• 具有四象限操作功能，适用于各种复杂的测试场景。
5. 瞬态响应：
• 采用SourceAdapt技术，可根据负载特性调整瞬态响应，提高稳定性和测量精度。

三、产品特点

1. 高精度：
• 高分辨率和高速采集能力确保了测量的准确性。
2. 灵活性：
• 高通道密度和确定性硬件序列减少了测试时间并增加了灵活性。
• 灵活的采样率和流盘能力允许将仪器当做数字化仪使用，以捕获瞬态行为。
3. 稳定性：
• SourceAdapt技术降低了SMU稳定时间，并在高容性负载情况下最小化过冲和振荡。
4. 易用性：
• 支持多种仪器设备硬件，用户可以根据测试需求快速配置和应用。

四、应用领域

NI PXIe-4139 PXI源测量单元适合多种应用领域，包括但不限于：

• 集成电路（IC）测试：用于ICs、电源管理ICs（PMICs）和射频ICs（RFICs）等器件的制造测试和特性分析。
• 分立元件测试：如LED和光收发仪等分立元件的测试。
• 板卡级测试：在电路板级别的测试中提供精确的电源和测量功能。
• 实验室特性分析：在实验室环境中进行各种电子器件和系统的特性分析。

The NI American PXIe-4139 PXI source measurement unit is a high-precision system source measurement unit (SMU) with excellent performance and a wide range of application areas. The following is a detailed introduction to the product:

1、 Product Overview

Brand: National Instruments (NI)

Model: PXIe-4139

Type: PXI Source Measurement Unit

2、 Technical specifications

Voltage and current range:

It can provide a DC voltage of ± 60V and a DC current of ± 3A.

The pulse current capability reaches ± 10A.

Power:

The DC power output can reach up to 40W.

Measurement accuracy:

Equipped with an analog-to-digital converter, capable of performing high-precision measurements with a current resolution of 100fA.

The high-speed acquisition capability is as high as 1.8MS/s.

Operation mode:

Equipped with four quadrant operation function, suitable for various complex testing scenarios.

Transient response:

By using SourceAdapt technology, transient response can be adjusted according to load characteristics, improving stability and measurement accuracy.

3、 Product Features

high-precision:

The high resolution and high-speed acquisition capability ensure the accuracy of the measurement.

Flexibility:

High channel density and deterministic hardware sequences reduce testing time and increase flexibility.

The flexible sampling rate and flow disk capability allow the instrument to be used as a digitizer to capture transient behavior.

Stability:

The SourceAdapt technology reduces the stability time of SMU and minimizes overshoot and oscillation under high capacity load conditions.

Usability:

Supports multiple instrument and device hardware, allowing users to quickly configure and apply according to testing needs.

4、 Application Fields

The NI PXIe-4139 PXI source measurement unit is suitable for various application fields, including but not limited to:

Integrated Circuit (IC) Testing: Used for manufacturing, testing, and characteristic analysis of devices such as ICs, Power Management ICs (PMICs), and Radio Frequency ICs (RFICs).

Discrete component testing: testing of discrete components such as LEDs and optical transceivers.

Board level testing: Provides precise power and measurement functions in circuit board level testing.

Laboratory characteristic analysis: Conduct characteristic analysis of various electronic devices and systems in a laboratory environment.

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