PXIe-4143 4通道精密PXI源测量单元
PXIe-4143 4通道精密PXI源测量单元
PXIe-4143 4通道精密PXI源测量单元
PXIe-4143 4通道精密PXI源测量单元(SMU)是一款高性能的测试仪器,专为高引脚数应用设计。以下是对该产品的详细介绍:
PXIe-4143 4通道精密PXI源测量单元广泛应用于各种自动化测试和实验室特性分析应用中,包括但不限于:
The PXIe-4143 4-channel Precision PXI Source Measurement Unit (SMU) is a high-performance testing instrument designed specifically for high pin count applications. The following is a detailed introduction to the product:
1、 Product Overview
Brand: National Instruments (NI)
Model: PXIe-4143
Type: 4-channel precision PXI source measurement unit
2、 Technical specifications
Number of channels: 4 identical SMU channels, suitable for parallel testing.
Voltage range: ± 24V, meeting various testing requirements.
Current range: ± 150mA, suitable for low-power applications.
Current sensitivity: High current measurement sensitivity, very suitable for measuring various current characteristics including reactive current.
Operation mode: Adopting a four quadrant operation mode, each channel integrates remote (4-wire) sensing function to ensure measurement accuracy.
3、 Product Features
High precision: Integrated sensing function and high current measurement sensitivity provide high-precision measurement results.
High speed: With the help of a high-speed sequential engine, users can achieve synchronization between SMUs or with other instruments, improving testing efficiency.
Flexibility: The PXIe-4143 can be customized to respond to any load, achieving stable and small transient responses to meet the needs of different testing scenarios.
High density: There can be up to 68 channels on a single 4U PXI chassis, providing industry-leading channel density.
Modularization: The modular PXI platform enables you to trigger these source measurement units (SMUs) through the PXI backplane to synchronize measurements with other instruments, including high-speed digital I/O instruments, RF analyzers, generators, high-speed digitizers, etc.
4、 Application Fields
The PXIe-4143 4-channel precision PXI source measurement unit is widely used in various automated testing and laboratory characteristic analysis applications, including but not limited to:
Semiconductor testing: such as MEMS system testing, open/short circuit detection, RF integrated circuit (RFID) power supply, etc.
Electronic component testing: testing of components such as resistors, capacitors, inductors, etc.
Circuit board testing: Provide precise power and measurement functions in circuit board level testing.
Laboratory research: Conducting characteristic analysis of various electronic devices and systems in a laboratory environment.
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