PXIe-4135数据采集卡是一款由美国国家仪器(National Instruments,简称NI)生产的高精度系统源测量单元(SMU)。以下是对该产品的详细介绍:
PXIe-4135数据采集卡适用于多种测试测量领域,包括但不限于:
The PXIe-4135 data acquisition card is a high-precision system source measurement unit (SMU) produced by National Instruments (NI) in the United States. The following is a detailed introduction to the product:
1、 Product Overview
Brand: National Instruments (NI)
Model: PXIe-4135
Type: Data Acquisition Card/System Source Measurement Unit (SMU)
2、 Technical specifications
Voltage and current capability:
It can provide a DC voltage of ± 200V and a DC current of ± 1A.
The pulse current capability can reach ± 3A, and the pulse power can reach 480W.
Power output:
The DC power output can reach up to 40W, meeting various testing requirements.
Measurement accuracy:
Equipped with a high-precision analog-to-digital converter, capable of performing high-precision measurements with a current resolution of 10fA.
The high-speed data acquisition capability is up to 1.8MS/s, suitable for application scenarios that require high-speed data acquisition.
Operation mode:
Supports four quadrant operation mode, suitable for various complex testing scenarios.
Connectors and interfaces:
Equipped with native three-axis connectors to ensure the stability and reliability of signal transmission.
3、 Product Features
high-precision:
The high resolution and high-speed acquisition capability ensure the accuracy of the measurement.
Flexibility:
Flexible configuration according to testing requirements, supporting multiple testing modes and parameter settings.
Stability:
By using SourceAdapt technology, transient response can be adjusted according to load characteristics, improving stability and measurement accuracy.
Usability:
Provide a user-friendly interface and rich documentation support, making it easy for users to quickly get started and conduct testing.
4、 Application Fields
The PXIe-4135 data acquisition card is suitable for various testing and measurement fields, including but not limited to:
Manufacturing testing: Testing electronic components, circuit boards, etc. on the production line to ensure product quality.
Board level testing: Provides precise power and measurement functions in circuit board level testing.
Laboratory characteristic analysis: Conduct characteristic analysis of various electronic devices and systems in a laboratory environment.
Semiconductor testing: used for testing semiconductor devices such as ICs, power management ICs (PMICs), and RFICs.
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